This next-generation Hall measurement software enables easy system operation, provides a suite of data acquisition and analysis tools, and allows you to control field, sample temperature, and sample excitation while running Hall measurements in an automated fashion.*

Notable Software Features

• Supports van der Pauw and Hall bar measurements, and measuring samples with gated Hall bars to account for gate bias—ideal for device-level material measurement.
• Create a variable temperature Hall measurement with just three clicks of a mouse.
• Start and end a measurement at your convenience, as well as set up time loops to repeat measurements according to a schedule.
• Easily insert a resistance measurement into a Hall measurement sequence.
• Use quick commands to "Go to Temperature," "Go to Field," "Go to GBV" (gate bias voltage), and "Wait," to let the system pause and settle before continuing.
• Perform resistance measurements at the start of an experiment—very useful when you need to do a quick, initial sample check to determine usable current, for instance.
• Supports data export for multi-carrier analysis.

*Manual adjustment of the probe station's heat switch is required at several temperature points.

Easily Add Hall Measurement Capabilities to Your Probe Station

• A complete solution for enabling Hall measurements in a CRX-VF probe station
• Supports a range of DC Hall measurements on wafer-scale materials and structures as a function of temperature and field
• Includes all the instrumentation and software for facilitating Hall measurements
• Supports DC fields to 2 T and resistances from 0.5 mΩ to 100 GΩ
• Intuitive software provides easy system operation, data acquisition, and analysis
• Supports exporting of data for multi-carrier analysis
• 3-year standard warranty

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