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Benchtop Atomic Force Microscopy


The nGauge atomic force microscope (AFM) is an easy-to-use and affordable benchtop AFM instrument designed for the individual scientist and smaller labs to capture 3D images at the nanoscale. Incorporating ICSPI's AFM-on-a-Chip technology, it provides researchers and scientists nanoscale 3D scans in a few minutes in their own lab and on their own bench. The nGauge AFM uses piezoresistive sensors which allow for alignment-free operation and a fully automatic approach. ICSPI is on a mission to bring robust, easy-to-use nanoscale metrology to everyone.


  • Fast: Collect data in 2 minutes
  • Easy: Scans in 3 clicks
  • Small: System weighs 500 g
  • Scan Size: 20 µm x 20 µm
  • XY Scanner Resolution: <0.5 nm
  • Quick Scan: 16 seconds
  • High-Resolution Scan: 5 minutes
  • Max. Resolution: 1024 x 1024 pixels

Possible Applications

  • Polymers and Composites
  • Semiconductor Devices and Microfabrication
  • Metals, Minerals and Ceramics
  • Nanoparticles and Nanomaterials
  • Biology and Life Science
  • Film Thickness, Step Heights and Coatings
  • Education

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