Benchtop Atomic Force Microscopy
ICSPI nGauge AFM
The nGauge atomic force microscope (AFM) is an easy-to-use and affordable benchtop AFM instrument designed for the individual scientist and smaller labs to capture 3D images at the nanoscale. Incorporating ICSPI's AFM-on-a-Chip technology, it provides researchers and scientists nanoscale 3D scans in a few minutes in their own lab and on their own bench. The nGauge AFM uses piezoresistive sensors which allow for alignment-free operation and a fully automatic approach. ICSPI is on a mission to bring robust, easy-to-use nanoscale metrology to everyone.
Features
- Fast: Collect data in 2 minutes
- Easy: Scans in 3 clicks
- Small: System weighs 500 g
- Scan Size: 20 µm x 20 µm
- XY Scanner Resolution: <0.5 nm
- Quick Scan: 16 seconds
- High-Resolution Scan: 5 minutes
- Max. Resolution: 1024 x 1024 pixels
Possible Applications
- Polymers and Composites
- Semiconductor Devices and Microfabrication
- Metals, Minerals and Ceramics
- Nanoparticles and Nanomaterials
- Biology and Life Science
- Film Thickness, Step Heights and Coatings
- Education
